Validation of a three-dimensional transmission line matrix (TLM) model implementation of a mode-stirred reverberation chamber

Alyse Coates, Hugh G. Sasse, Dawn E. Coleby, Alistair P. Duffy, Antonio Orlandi

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

Reverberation chambers are attractive electromagnetic compatibility test facilities, both economically and technically. Careful design and analysis of these facilities are important, if the results obtained are to be treated with a high level of confidence. Numerical modeling is an important part of the process of reverberation chamber design and analysis. Hence, it is important that the modeling techniques to be used are appropriately validated. Much of the published work to date takes either a statistical or a deterministic view of validation. This paper provides validation evidence for a low-resolution transmission line matrix (TLM) model of a reverberation chamber in a manner approximating the way in which the chamber is used, i.e., validating based on the effects of a simple device under test. A variety of statistical and heuristic approaches have been used to quantify the level of agreement, intending to set the likely lower bound for the quality of comparisons between simulations and measurements. While not drawing any "universal" conclusions about the veracity of the TLM technique, the paper concludes that a relatively simple model of a reverberation chamber provides a useful analysis of the chamber with close comparisons between modeled and measured data.

Original languageEnglish
Pages (from-to)734-744
Number of pages11
JournalIEEE Transactions on Electromagnetic Compatibility
Volume49
Issue number4
DOIs
Publication statusPublished - Nov 2007
Externally publishedYes

Keywords

  • Mode-stirred chamber
  • Reverberation chamber
  • Test facilities
  • Testing
  • Transmission Line
  • Transmission line matrix (TLM)
  • Validation

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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