Validation for Micro- and Nano-Sensors

M. Henry

Validation for Micro- and Nano-Sensors

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding › peer-review

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Abstract

The rapid development of sensor and processing technologies is offering many opportunities for embedding new functionality within sensing devices. One important area is the development of diagnostics. While the generation of diagnostic error codes is becoming common, these can be difficult to integrate into a wider control system, and do not address the more fundamental issue of the quality of the underlying measurement. The SEVA (sensor validation) approach, which is now embedded in a Brtish Standard (BS-7986) proposes that each sensor assesses the quality of each measurement value is generates, including the influence of any diagnosed faults, in order to generate an on-line uncertainy value. This talk will give examples of sensors and techniques for validation, including its application to a micro-machined flow meter.

Original language	English
Title of host publication	Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show
Publisher	TechConnect
Pages	463 - 466
Number of pages	4
Volume	3
ISBN (Electronic)	0-9767985-8-1
Publication status	Published - 7 May 2006
Externally published	Yes
Event	NSTI Nanotechnology Conference and Trade Show - Boston, United States Duration: 1 May 2006 → 11 May 2006 http://www.nsti.org/Nanotech2006/

Conference

Conference	NSTI Nanotechnology Conference and Trade Show
Country/Territory	United States
City	Boston
Period	1/05/06 → 11/05/06
Internet address	http://www.nsti.org/Nanotech2006/

Bibliographical note

Open access publication

Keywords

MEMS
sensors

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PublishedFinal published version, 1.47 MBLicence: Unspecified

Cite this

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title = "Validation for Micro- and Nano-Sensors",

abstract = "The rapid development of sensor and processing technologies is offering many opportunities for embedding new functionality within sensing devices. One important area is the development of diagnostics. While the generation of diagnostic error codes is becoming common, these can be difficult to integrate into a wider control system, and do not address the more fundamental issue of the quality of the underlying measurement. The SEVA (sensor validation) approach, which is now embedded in a Brtish Standard (BS-7986) proposes that each sensor assesses the quality of each measurement value is generates, including the influence of any diagnosed faults, in order to generate an on-line uncertainy value. This talk will give examples of sensors and techniques for validation, including its application to a micro-machined flow meter.",

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AU - Henry, M.

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N2 - The rapid development of sensor and processing technologies is offering many opportunities for embedding new functionality within sensing devices. One important area is the development of diagnostics. While the generation of diagnostic error codes is becoming common, these can be difficult to integrate into a wider control system, and do not address the more fundamental issue of the quality of the underlying measurement. The SEVA (sensor validation) approach, which is now embedded in a Brtish Standard (BS-7986) proposes that each sensor assesses the quality of each measurement value is generates, including the influence of any diagnosed faults, in order to generate an on-line uncertainy value. This talk will give examples of sensors and techniques for validation, including its application to a micro-machined flow meter.

AB - The rapid development of sensor and processing technologies is offering many opportunities for embedding new functionality within sensing devices. One important area is the development of diagnostics. While the generation of diagnostic error codes is becoming common, these can be difficult to integrate into a wider control system, and do not address the more fundamental issue of the quality of the underlying measurement. The SEVA (sensor validation) approach, which is now embedded in a Brtish Standard (BS-7986) proposes that each sensor assesses the quality of each measurement value is generates, including the influence of any diagnosed faults, in order to generate an on-line uncertainy value. This talk will give examples of sensors and techniques for validation, including its application to a micro-machined flow meter.

KW - MEMS

KW - sensors

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-33845199425&partnerID=MN8TOARS

M3 - Conference proceeding

VL - 3

SP - 463

EP - 466

BT - Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show

PB - TechConnect

T2 - NSTI Nanotechnology Conference and Trade Show

Y2 - 1 May 2006 through 11 May 2006

ER -

Validation for Micro- and Nano-Sensors

Abstract

Conference

Bibliographical note

Keywords

Access to Document

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Cite this