Abstract
Recently several authors have turned their attention to the design problems of very large arrays of intelligent sensors, such as would be suitable for inclusion as an integral part of a 'smart structure'. Such systems have architectural and data throughput advantages, but to be used effectively need to be designed so as to be 'controllerless' and 'decentralised'. This paper looks at the system level issues of how neural network based analytical and diagnostic capabilities may be integrated into such an array of sensors. Event based models of the interactions of the system are presented, using the π-calculus. The neural network diagnostics are modeled at a systems interface level. © 2003 IEEE.
| Original language | English |
|---|---|
| Title of host publication | 2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2003. AIM 2003 |
| Publisher | IEEE |
| Pages | 356-359 |
| Number of pages | 6 |
| ISBN (Print) | 0-7803-7759-1 |
| DOIs | |
| Publication status | Published - 2003 |
| Event | IEEE/ASME International Conference on Advanced Intelligent Mechatronics - Kobe, Japan Duration: 20 Jul 2003 → 24 Jul 2003 |
Conference
| Conference | IEEE/ASME International Conference on Advanced Intelligent Mechatronics |
|---|---|
| Abbreviated title | AIM 2003 |
| Country/Territory | Japan |
| City | Kobe |
| Period | 20/07/03 → 24/07/03 |
Keywords
- Accelerometers
- Calculations
- Fault detection
- Intelligent control
- Intelligent mechatronics
- Neural networks
- Redundancy
- Sensor arrays
- Smart sensors
- Vibration analysis
- Event-based model
- Intelligent sensors
- Network diagnostics
- Performance analysis
- Sensor systems
- Systems interfaces
- Vibrations
- Capacitive sensors
- Diagnostic capabilities