Abstract
With the advantage of high bandwidth and small insertion impedance, a current surface probe (CSP) used to measure switching current waveforms is presented in this letter. Its transfer impedance is characterized and validated by measuring an IGBT switching current that is compared with those obtained with a current probe and a Hall effect current probe. Furthermore, by comparing with a current shunt to measure a GaN-HEMT switching current, it is shown that CSP is able to measure a switching current of a few nanoseconds, while it brings no influence on transistor voltage waveform measurement. The obtained results show that the use of CSP brings little parasitic inductances in the measurement circuit and it does not bring the connection of the ground to the power converter.
| Original language | English |
|---|---|
| Article number | 6965614 |
| Pages (from-to) | 2911-2917 |
| Number of pages | 7 |
| Journal | IEEE Transactions on Power Electronics |
| Volume | 30 |
| Issue number | 6 |
| Early online date | 24 Nov 2014 |
| DOIs | |
| Publication status | Published - 1 Jun 2015 |
| Externally published | Yes |
Bibliographical note
© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Keywords
- Current measurement
- Current shunt (CS)
- Current surface probe (CSP)
- Fast switching current
- Gallium nitride (GaN)
- Probe transfer impedance
ASJC Scopus subject areas
- Electrical and Electronic Engineering