User requirements for measurement validation

    Research output: Contribution to journalConference articlepeer-review

    1 Citation (Scopus)

    Abstract

    The importance of integrating test support into the next generation of intelligent sensors has evolved to a point where DfT is becoming mandatory and BIST features key specifications to ensure system test does not dominate manufacturing costs and performance can be guaranteed in the field to satisfy safety critical specifications. This paper summarises the issues and describes an example of how an efficient on-line test mode can be implemented at minimal additional cost. Other work that may provide designers with efficient test options includes on-line test functions for fully differential interface circuits and BIST structures for interface functions such as amplifiers, filters and converters implemented in switched current technology. In addition, the extension of a reliability indicator technique referred to as IDDQ for digital ASICS may be practical to allow use with mixed signal integrated systems
    Original languageEnglish
    JournalIEE Colloquium (Digest)
    DOIs
    Publication statusPublished - 1996
    EventIEE Colloquium on Intelligent Sensors - Leicester, United Kingdom
    Duration: 19 Sep 199619 Sep 1996

    Fingerprint Dive into the research topics of 'User requirements for measurement validation'. Together they form a unique fingerprint.

    Cite this