The strength of thin films, small structures and materials under localised stresses

B. Ehrler, D.J. Dunstan, T.T. Zhu, X.D. Hou, K.M.Y. P'ng, A.J. Bushby

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


Critical thickness theory explains an excess yield stress in thin films inversely proportional to the film thickness. However, in other contexts, an excess yield stress is often observed which is proportional to the inverse square-root of a relevant dimension. Work-hardening coefficients show both inverse and inverse square-root behaviours. We review recent experimental work which has demonstrated these effects unambiguously, and discuss the extent to which they can be theoretically understood.
Original languageUndefined
Pages (from-to)3781-3783
Number of pages3
JournalThin Solid Films
Issue number13
Publication statusPublished - 2009


  • Micromechanics
  • Size effect
  • Strength
  • Thin films

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