The Integrated Error against Log Frequency (IELF) method for CEM validation

R. J. Simpson, C. R. Jones, I. MacDiarmid, A. Duffy, D. Coleby

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

15 Citations (Scopus)

Abstract

Data with a high feature density is common within EMC measurements and modeling, particularly in the complex and substantially overmoded environments found in aerospace EMC environments. Comparison of experimental and modeled data based on visual assessment of the graphical representation of the data is common and requires both extensive experience and detailed system knowledge in order to be able to interpret the comparisons with confidence. However, in circumstances where a quantification of this comparison is called for, such as when sharing results across partner organizations, obtaining a single representative figure of merit is challenging. The Integrated Error against Log Frequency (IELF) method was developed to provide this quantification. It is based on the view that the most significant aspect of the data to be compared is a function of the difference between the two traces being compared, particularly when the individual features are difficult to discriminate. This paper presents the IELF method and demonstrates its potential.

Original languageEnglish
Title of host publication2005 International Symposium on Electromagnetic Compatibility, EMC 2005
Pages296-300
Number of pages5
Volume1
DOIs
Publication statusPublished - 2005
Externally publishedYes
Event2005 International Symposium on Electromagnetic Compatibility, EMC 2005 - Chicago, United States
Duration: 8 Aug 200512 Aug 2005

Conference

Conference2005 International Symposium on Electromagnetic Compatibility, EMC 2005
CountryUnited States
CityChicago
Period8/08/0512/08/05

Fingerprint

Electromagnetic compatibility
aerospace environments
figure of merit
confidence

Keywords

  • CEM
  • IELF
  • Repeatability
  • Validation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Simpson, R. J., Jones, C. R., MacDiarmid, I., Duffy, A., & Coleby, D. (2005). The Integrated Error against Log Frequency (IELF) method for CEM validation. In 2005 International Symposium on Electromagnetic Compatibility, EMC 2005 (Vol. 1, pp. 296-300). [1513517] https://doi.org/10.1109/ISEMC.2005.1513517

The Integrated Error against Log Frequency (IELF) method for CEM validation. / Simpson, R. J.; Jones, C. R.; MacDiarmid, I.; Duffy, A.; Coleby, D.

2005 International Symposium on Electromagnetic Compatibility, EMC 2005. Vol. 1 2005. p. 296-300 1513517.

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

Simpson, RJ, Jones, CR, MacDiarmid, I, Duffy, A & Coleby, D 2005, The Integrated Error against Log Frequency (IELF) method for CEM validation. in 2005 International Symposium on Electromagnetic Compatibility, EMC 2005. vol. 1, 1513517, pp. 296-300, 2005 International Symposium on Electromagnetic Compatibility, EMC 2005, Chicago, United States, 8/08/05. https://doi.org/10.1109/ISEMC.2005.1513517
Simpson RJ, Jones CR, MacDiarmid I, Duffy A, Coleby D. The Integrated Error against Log Frequency (IELF) method for CEM validation. In 2005 International Symposium on Electromagnetic Compatibility, EMC 2005. Vol. 1. 2005. p. 296-300. 1513517 https://doi.org/10.1109/ISEMC.2005.1513517
Simpson, R. J. ; Jones, C. R. ; MacDiarmid, I. ; Duffy, A. ; Coleby, D. / The Integrated Error against Log Frequency (IELF) method for CEM validation. 2005 International Symposium on Electromagnetic Compatibility, EMC 2005. Vol. 1 2005. pp. 296-300
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