Survey of lockstep based mitigation techniques for soft errors in embedded systems

Eduardo Weber Wachter; S. Kasap; Xiaojun Zhai; Sohaib Ehsan; K. D. McDonald-Maier

doi:10.1109/CEEC47804.2019.8974333

Survey of lockstep based mitigation techniques for soft errors in embedded systems

Eduardo Weber Wachter
, S. Kasap
, Xiaojun Zhai
, Sohaib Ehsan
, K. D. McDonald-Maier

University of Essex

Research output: Chapter in Book/Report/Conference proceeding › Conference proceeding › peer-review

12 Citations (Scopus)

Abstract

Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.

Original language	English
Title of host publication	2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings
Publisher	IEEE
Pages	124 - 127
Number of pages	4
ISBN (Electronic)	978-1-7281-2952-5
DOIs	https://doi.org/10.1109/CEEC47804.2019.8974333
Publication status	Published - 2019
Externally published	Yes
Event	Computer Science and Electronic Engineering Conference - Colchester, United Kingdom Duration: 18 Sept 2019 → 20 Sept 2019 Conference number: 11 https://www.essex.ac.uk/events/2019/09/18/computer-science-and-electronic-engineering-conference-2019

Conference

Conference	Computer Science and Electronic Engineering Conference
Abbreviated title	CEEC 2019
Country/Territory	United Kingdom
City	Colchester
Period	18/09/19 → 20/09/19
Internet address	https://www.essex.ac.uk/events/2019/09/18/computer-science-and-electronic-engineering-conference-2019

Keywords

Lockstep
Reliability
Fault tolerance
soft error mitigation
radiation effects

Access to Document

10.1109/CEEC47804.2019.8974333

Cite this

Wachter, EW, Kasap, S, Zhai, X, Ehsan, S & McDonald-Maier, KD 2019, Survey of lockstep based mitigation techniques for soft errors in embedded systems. in 2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings. IEEE, pp. 124 - 127, Computer Science and Electronic Engineering Conference, Colchester, United Kingdom, 18/09/19. https://doi.org/10.1109/CEEC47804.2019.8974333

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title = "Survey of lockstep based mitigation techniques for soft errors in embedded systems",

abstract = "Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.",

keywords = "Lockstep, Reliability, Fault tolerance, soft error mitigation, radiation effects",

author = "Wachter, \{Eduardo Weber\} and S. Kasap and Xiaojun Zhai and Sohaib Ehsan and McDonald-Maier, \{K. D.\}",

year = "2019",

doi = "10.1109/CEEC47804.2019.8974333",

language = "English",

pages = "124 -- 127",

booktitle = "2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings",

publisher = "IEEE",

address = "United States",

note = "Computer Science and Electronic Engineering Conference, CEEC 2019 ; Conference date: 18-09-2019 Through 20-09-2019",

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T1 - Survey of lockstep based mitigation techniques for soft errors in embedded systems

AU - Wachter, Eduardo Weber

AU - Kasap, S.

AU - Zhai, Xiaojun

AU - Ehsan, Sohaib

AU - McDonald-Maier, K. D.

N1 - Conference code: 11

PY - 2019

Y1 - 2019

N2 - Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.

AB - Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.

KW - Lockstep

KW - Reliability

KW - Fault tolerance

KW - soft error mitigation

KW - radiation effects

UR - https://www.scopus.com/pages/publications/85079341818

U2 - 10.1109/CEEC47804.2019.8974333

DO - 10.1109/CEEC47804.2019.8974333

M3 - Conference proceeding

SP - 124

EP - 127

BT - 2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings

PB - IEEE

T2 - Computer Science and Electronic Engineering Conference

Y2 - 18 September 2019 through 20 September 2019

ER -

Survey of lockstep based mitigation techniques for soft errors in embedded systems

Abstract

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Keywords

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