Survey of lockstep based mitigation techniques for soft errors in embedded systems

Eduardo Weber Wachter, S. Kasap, Xiaojun Zhai, Sohaib Ehsan, K. D. McDonald-Maier

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

Abstract

Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.
Original languageEnglish
Title of host publication2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings
PublisherIEEE
Pages124 - 127
Number of pages4
ISBN (Electronic)978-1-7281-2952-5
DOIs
Publication statusPublished - 2019
Externally publishedYes
EventComputer Science and Electronic Engineering Conference - Colchester, United Kingdom
Duration: 18 Sep 201920 Sep 2019
Conference number: 11
https://www.essex.ac.uk/events/2019/09/18/computer-science-and-electronic-engineering-conference-2019

Conference

ConferenceComputer Science and Electronic Engineering Conference
Abbreviated titleCEEC 2019
CountryUnited Kingdom
CityColchester
Period18/09/1920/09/19
Internet address

Keywords

  • Lockstep
  • Reliability
  • Fault tolerance
  • soft error mitigation
  • radiation effects

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  • Cite this

    Wachter, E. W., Kasap, S., Zhai, X., Ehsan, S., & McDonald-Maier, K. D. (2019). Survey of lockstep based mitigation techniques for soft errors in embedded systems. In 2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings (pp. 124 - 127). IEEE. https://doi.org/10.1109/CEEC47804.2019.8974333