Survey of lockstep based mitigation techniques for soft errors in embedded systems

Eduardo Weber Wachter, S. Kasap, Xiaojun Zhai, Sohaib Ehsan, K. D. McDonald-Maier

Research output: Chapter in Book/Report/Conference proceedingConference proceedingpeer-review

7 Citations (Scopus)


Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.
Original languageEnglish
Title of host publication2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings
Pages124 - 127
Number of pages4
ISBN (Electronic)978-1-7281-2952-5
Publication statusPublished - 2019
Externally publishedYes
EventComputer Science and Electronic Engineering Conference - Colchester, United Kingdom
Duration: 18 Sept 201920 Sept 2019
Conference number: 11


ConferenceComputer Science and Electronic Engineering Conference
Abbreviated titleCEEC 2019
Country/TerritoryUnited Kingdom
Internet address


  • Lockstep
  • Reliability
  • Fault tolerance
  • soft error mitigation
  • radiation effects


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