Abstract
Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.
Original language | English |
---|---|
Title of host publication | 2019 11th Computer Science and Electronic Engineering Conference, CEEC 2019 - Proceedings |
Publisher | IEEE |
Pages | 124 - 127 |
Number of pages | 4 |
ISBN (Electronic) | 978-1-7281-2952-5 |
DOIs | |
Publication status | Published - 2019 |
Externally published | Yes |
Event | Computer Science and Electronic Engineering Conference - Colchester, United Kingdom Duration: 18 Sept 2019 → 20 Sept 2019 Conference number: 11 https://www.essex.ac.uk/events/2019/09/18/computer-science-and-electronic-engineering-conference-2019 |
Conference
Conference | Computer Science and Electronic Engineering Conference |
---|---|
Abbreviated title | CEEC 2019 |
Country/Territory | United Kingdom |
City | Colchester |
Period | 18/09/19 → 20/09/19 |
Internet address |
Keywords
- Lockstep
- Reliability
- Fault tolerance
- soft error mitigation
- radiation effects