Strength of coherently strained nanolayers under high temperature nanoindentation

K.M.Y. P'ng, X.D. Hou, D.J. Dunstan, A.J. Bushby

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

Abstract

Semiconductor strained layer superlattices are an ideal model material to study the effects of coherency strain in plasticity, due to the fine control of nanolayer thickness and internal strain afforded by MBE deposition. Previously, nanoindentation of bulk InGaAs at 300K gave a yield pressure of 6GPa (Jayawera et al Proc. Roy Soc, A459, 2049, 2003) while bending at 500 centigrade gave a yield value of 30MPa (Pp’ ng et al Phil. Mag. 85, 4429, 2005). In contrast, coherently strained InGaAs superlattices gave nanoindentation values of 3GPa at room temperature and bending at 500oC gave a yield value also around 3GPa. It appears that the coherency strain can impart an athermal strengthening to the superlattice. It is clearly necessary to do mechanical testing over the range 300-800K that will be able to link the room temperature nanoindentation with the results from the high temperature bending experiment and to determine the relationship between strength, coherency strain and temperature. Preliminary experiments on these samples at elevated temperatures using a hot stage and the UMIS nanoindentation system is difficult but feasible with the help of AFM to verify the contact area.
Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherCurran Associates inc.
Pages103-108
Number of pages6
Volume977
ISBN (Print)9781604234251
DOIs
Publication statusPublished - 2006
EventMaterials Research Society Symposium - Boston, Massachusetts, United States
Duration: 27 Nov 20061 Dec 2006

Conference

ConferenceMaterials Research Society Symposium
CountryUnited States
CityBoston, Massachusetts
Period27/11/061/12/06

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    P'ng, K. M. Y., Hou, X. D., Dunstan, D. J., & Bushby, A. J. (2006). Strength of coherently strained nanolayers under high temperature nanoindentation. In Materials Research Society Symposium Proceedings (Vol. 977, pp. 103-108). Curran Associates inc.. https://doi.org/10.1557/PROC-977-0977-FF07-04-EE07-04