Abstract
Brushless doubly-fed induction machines (BDFIM) are attractive generators to be used in wind turbines due to the absence of brushes and slip rings. Furthermore, the BDFIM is a medium-speed generator and hence only requires one or two-stage gearbox. This feature simplifies the gearbox system and therefore improve reliability and reduce maintenance costs for the wind turbine. Although the design and operation of the BDFIM has been widely studied in the literature, there are only few studies on reliability assessment of the machine as a wind turbine generator. This paper proposes a comprehensive reliability model for two wind turbine drivetrain configurations: One with doubly-fed induction generator, and the other when the BDFIM is employed as the generator. The model is capable of evaluating the failure rate and repair rate indexes for the both configurations. Real field survey data from a 90 MW wind farm as well as calculated reliability data are then utilised to determine the reliability index values for the two drivetrain configurations in order to compare their reliability performance.
Original language | English |
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Title of host publication | 2021 22nd IEEE International Conference on Industrial Technology (ICIT) |
Publisher | IEEE |
Pages | 228-233 |
Number of pages | 6 |
ISBN (Electronic) | 978-1-7281-5730-6, 978-1-7281-5729-0 |
DOIs | |
Publication status | E-pub ahead of print - 18 Jun 2021 |
Event | 22nd IEEE International Conference on Industrial Technology - Valencia, Spain Duration: 10 Mar 2021 → 12 Mar 2021 https://ieee-icit2021.org/ |
Conference
Conference | 22nd IEEE International Conference on Industrial Technology |
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Abbreviated title | IEEE ICIT2021 |
Country/Territory | Spain |
City | Valencia |
Period | 10/03/21 → 12/03/21 |
Internet address |
Keywords
- brushless Doubly-fed induction machines
- failure rate
- mean time to failure
- mean time to repair
- reliability assessment
- repair rate
- wind turbine drivetrain
ASJC Scopus subject areas
- Computer Science Applications
- Electrical and Electronic Engineering