Radiance Meter for Laser Beam Measurement and characterization

Pratik Shukla (Inventor)

Research output: Patent

Original languageEnglish
Publication statusPublished - 30 Jun 2019

Cite this

@misc{dd3106612a234a4e90834296d7c71154,
title = "Radiance Meter for Laser Beam Measurement and characterization",
author = "Pratik Shukla",
year = "2019",
month = "6",
day = "30",
language = "English",
type = "Patent",

}

TY - PAT

T1 - Radiance Meter for Laser Beam Measurement and characterization

AU - Shukla, Pratik

PY - 2019/6/30

Y1 - 2019/6/30

M3 - Patent

ER -