Probing the electronic structure of fine and large-grained SnO2 layers by spectroscopic ellipsometry and current-voltage measurements

Christos Petaroudis, Ioannis Kostis, Petros Panagis Filippatos, Alexander Chroneos, Anastasia Soultati, Maria Vasilopoulou, Dimitris Davazoglou

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Engineering & Materials Science

Chemistry

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