In the present study, structural characterization of yttria stabilized zirconia (YSZ) thin film developed by pulsed laser deposition under optimum condition has been undertaken. The X-ray diffraction analysis of precursor YSZ powder used for the preparation of target showed presence of mixture of monoclinic as well as tetragonal zirconia. The YSZ thin films were deposited at different substrate temperature starting from room temperature to a maximum substrate temperature of 700 °C. The YSZ thin film deposited at substrate temperature of 700 °C have been found to the optimum temperature for deposition of YSZ thin film. The developed YSZ thin film showed presence of single phase tetragonal zirconia. The microstructural analysis reveals that the structure is very dense with the thickness 1.4 ± 0.2 m.
|Number of pages||3|
|Publication status||Published - 2015|
|Event||Laser and Plasma Application in Material Science - Kolkata, India|
Duration: 15 Jan 2015 → 17 Jan 2015
Conference number: 3
|Conference||Laser and Plasma Application in Material Science|
|Period||15/01/15 → 17/01/15|