Phase Structure and Microstructure Of Yttria Stabilized Zirconia Thin Film Developed By Pulsed Laser Deposition

Subhasisa Nath, Samit Kumar Ray, Indranil Manna, Jyotsna Dutta Majumdar

    Research output: Contribution to conferenceAbstract

    Abstract

    In the present study, structural characterization of yttria stabilized zirconia (YSZ) thin film developed by pulsed laser deposition under optimum condition has been undertaken. The X-ray diffraction analysis of precursor YSZ powder used for the preparation of target showed presence of mixture of monoclinic as well as tetragonal zirconia. The YSZ thin films were deposited at different substrate temperature starting from room temperature to a maximum substrate temperature of 700 °C. The YSZ thin film deposited at substrate temperature of 700 °C have been found to the optimum temperature for deposition of YSZ thin film. The developed YSZ thin film showed presence of single phase tetragonal zirconia. The microstructural analysis reveals that the structure is very dense with the thickness 1.4 ± 0.2 m.
    Original languageEnglish
    Pages64-66
    Number of pages3
    Publication statusPublished - 2015
    EventLaser and Plasma Application in Material Science - Kolkata, India
    Duration: 15 Jan 201517 Jan 2015
    Conference number: 3

    Conference

    ConferenceLaser and Plasma Application in Material Science
    Abbreviated titleLAPAMS
    CountryIndia
    CityKolkata
    Period15/01/1517/01/15

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    Nath, S., Ray, S. K., Manna, I., & Dutta Majumdar, J. (2015). Phase Structure and Microstructure Of Yttria Stabilized Zirconia Thin Film Developed By Pulsed Laser Deposition. 64-66. Abstract from Laser and Plasma Application in Material Science, Kolkata, India.