Modeling self-diffusion in UO2 and ThO2 by connecting point defect parameters with bulk properties

A. Chroneos, R.V. Vovk

    Research output: Contribution to journalArticlepeer-review

    70 Citations (Scopus)

    Fingerprint

    Dive into the research topics of 'Modeling self-diffusion in UO2 and ThO2 by connecting point defect parameters with bulk properties'. Together they form a unique fingerprint.

    Physics

    Chemistry

    Engineering

    Material Science