Abstract
Computational electromagnetics has been widely used since the ascendancy of computing. Validation of the resulting models has been a constant theme for developers, vendors and users, each wanting to be as confident as possible that the technique, code or model they are working with provides acceptable results in the situation in which it is being applied. However, no standardized procedure has been accepted to support this activity. A current IEEE activity aims to address this need, particularly with reference to applications in electromagnetic compatibility. One substantial question is how can confidence be quantified, allowing models to be compared with measurements to determine accuracy, or to compare models against other models to determine the level of difference. This paper addresses the issue of quantifying confidence setting this topic firmly in the progress of the standard activity to date.
| Original language | English |
|---|---|
| Pages (from-to) | 697-702 |
| Number of pages | 6 |
| Journal | IEEE International Symposium on Electromagnetic Compatibility |
| Volume | 2 |
| DOIs | |
| Publication status | Published - 2004 |
| Externally published | Yes |
| Event | IEEE International Symposium on Electromagnetic Compatability - Santa Clara, United States Duration: 9 Aug 2004 → 13 Aug 2004 |
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Keywords
- Benchmarking
- CEM
- FSV
- Validation
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
Cite this
Measuring similarity for validation of computational electromagnetic modelling. / Duffy, Alistair; Drozd, Andrew; Archambeault, Bruce; Coleby, Dawn.
In: IEEE International Symposium on Electromagnetic Compatibility, Vol. 2, 2004, p. 697-702.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Measuring similarity for validation of computational electromagnetic modelling
AU - Duffy, Alistair
AU - Drozd, Andrew
AU - Archambeault, Bruce
AU - Coleby, Dawn
PY - 2004
Y1 - 2004
N2 - Computational electromagnetics has been widely used since the ascendancy of computing. Validation of the resulting models has been a constant theme for developers, vendors and users, each wanting to be as confident as possible that the technique, code or model they are working with provides acceptable results in the situation in which it is being applied. However, no standardized procedure has been accepted to support this activity. A current IEEE activity aims to address this need, particularly with reference to applications in electromagnetic compatibility. One substantial question is how can confidence be quantified, allowing models to be compared with measurements to determine accuracy, or to compare models against other models to determine the level of difference. This paper addresses the issue of quantifying confidence setting this topic firmly in the progress of the standard activity to date.
AB - Computational electromagnetics has been widely used since the ascendancy of computing. Validation of the resulting models has been a constant theme for developers, vendors and users, each wanting to be as confident as possible that the technique, code or model they are working with provides acceptable results in the situation in which it is being applied. However, no standardized procedure has been accepted to support this activity. A current IEEE activity aims to address this need, particularly with reference to applications in electromagnetic compatibility. One substantial question is how can confidence be quantified, allowing models to be compared with measurements to determine accuracy, or to compare models against other models to determine the level of difference. This paper addresses the issue of quantifying confidence setting this topic firmly in the progress of the standard activity to date.
KW - Benchmarking
KW - CEM
KW - FSV
KW - Validation
U2 - 10.1109/ISEMC.2004.1349885
DO - 10.1109/ISEMC.2004.1349885
M3 - Article
VL - 2
SP - 697
EP - 702
JO - IEEE International Symposium on Electromagnetic Compatibility
JF - IEEE International Symposium on Electromagnetic Compatibility
SN - 1077-4076
ER -