Bibliographical noteThe full text of this item is not available from the repository. Please note Dr Jamshidi was working at the University of Bath at the time of publication.
- metrology process model
- measurement planning
- computer automated process planning (CAPP)
Maropoulos, P. G., Guo, Y., Jamshidi, J., & Cai, B. (2008). Large volume metrology process models: A framework for integrating measurement with assembly planning. CIRP Annals - Manufacturing Technology, 57(1), 477–480. https://doi.org/10.1016/j.cirp.2008.03.017