Large volume metrology process models: A framework for integrating measurement with assembly planning

P.G. Maropoulos, Y. Guo, Jafar Jamshidi, B. Cai

    Research output: Contribution to journalArticle

    50 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)477–480
    JournalCIRP Annals - Manufacturing Technology
    Volume57
    Issue number1
    DOIs
    Publication statusPublished - 2008

    Bibliographical note

    The full text of this item is not available from the repository. Please note Dr Jamshidi was working at the University of Bath at the time of publication.

    Keywords

    • metrology process model
    • measurement planning
    • computer automated process planning (CAPP)

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