Large volume metrology process models: A framework for integrating measurement with assembly planning

P.G. Maropoulos; Y. Guo; Jafar Jamshidi; B. Cai

doi:10.1016/j.cirp.2008.03.017

Large volume metrology process models: A framework for integrating measurement with assembly planning

P.G. Maropoulos, Y. Guo, Jafar Jamshidi, B. Cai

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	477–480
Journal	CIRP Annals - Manufacturing Technology
Volume	57
Issue number	1
DOIs	https://doi.org/10.1016/j.cirp.2008.03.017
Publication status	Published - 2008

Bibliographical note

The full text of this item is not available from the repository. Please note Dr Jamshidi was working at the University of Bath at the time of publication.

Keywords

metrology process model
measurement planning
computer automated process planning (CAPP)

Access to Document

10.1016/j.cirp.2008.03.017

Cite this

@article{4b89eae11e444dd09f2b3fe6851b979e,

title = "Large volume metrology process models: A framework for integrating measurement with assembly planning",

keywords = "metrology process model, measurement planning, computer automated process planning (CAPP)",

author = "P.G. Maropoulos and Y. Guo and Jafar Jamshidi and B. Cai",

note = "The full text of this item is not available from the repository. Please note Dr Jamshidi was working at the University of Bath at the time of publication.",

year = "2008",

doi = "10.1016/j.cirp.2008.03.017",

language = "English",

volume = "57",

pages = "477–480",

journal = "CIRP Annals - Manufacturing Technology",

issn = "0007-8506",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Large volume metrology process models: A framework for integrating measurement with assembly planning

AU - Maropoulos, P.G.

AU - Guo, Y.

AU - Jamshidi, Jafar

AU - Cai, B.

N1 - The full text of this item is not available from the repository. Please note Dr Jamshidi was working at the University of Bath at the time of publication.

PY - 2008

Y1 - 2008

KW - metrology process model

KW - measurement planning

KW - computer automated process planning (CAPP)

U2 - 10.1016/j.cirp.2008.03.017

DO - 10.1016/j.cirp.2008.03.017

M3 - Article

SN - 0007-8506

SN - 1726-0604

VL - 57

SP - 477

EP - 480

JO - CIRP Annals - Manufacturing Technology

JF - CIRP Annals - Manufacturing Technology

IS - 1

ER -