Abstract
The paper discusses the appropriateness of local sensor health monitoring/sensor fault diagnosis and suggests an artificial intelligence (AI) based solution to the diagnosis of sensor fault, in the context of sensor arrays. In contradistinction with the "centralized" methods currently used process/system fault detection, the work presented here aims to establish a process independent and sensor specific methodology for detecting and isolating sensor failures and fault recovery. The intelligent system proposed integrates the adaptability and learning ability of artificial neural networks with effective inter-sensor communication protocols. Micromachined accelerometers are considered as a case study. © 2003 IEEE.
Original language | English |
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Title of host publication | 2003 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2003. AIM 2003. Proceedings |
Publisher | IEEE |
Pages | 360-365 |
Number of pages | 6 |
DOIs | |
Publication status | Published - 4 Sept 2003 |
Event | IEEE/ASME International Conference on Advanced Intelligent Mechatronics - Kobe, Japan Duration: 20 Jul 2003 → 24 Jul 2003 |
Conference
Conference | IEEE/ASME International Conference on Advanced Intelligent Mechatronics |
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Abbreviated title | AIM 2003 |
Country/Territory | Japan |
City | Kobe |
Period | 20/07/03 → 24/07/03 |
Keywords
- Artificial intelligence
- Failure analysis
- Intelligent mechatronics
- Intelligent networks
- Intelligent systems
- Monitoring
- Neural networks
- Sensor arrays, Health diagnosis
- Health monitoring
- Intelligent sensing
- Intelligent sensors
- Learning abilities
- Micromachined accelerometers
- Sensor communication
- Sensor systems, Fault detection