In situ X-ray Diffraction investigation of Graphene-Enhanced Sn-Ag solder Alloys: Insights into phase transformations

This study focuses on the in situ X-ray Diffraction analysis of graphene nanosheet reinforced Sn-Ag lead-free solder alloys to investigate the impact of GNS on phase stability, texture evolution, and thermal behavior during heating and cooling cycles. The in situ XRD results reveal significant phase transformations, including the dissolution of the Ag3Sn intermetallic phase at elevated temperatures and its partial reformation upon cooling, highlighting the influence of GNS on phase stability. Texture analysis demonstrates the preferential alignment of specific crystallographic planes (100}, {010}, and {001}) in the Ag3Sn phase, facilitated by the presence of GNS acting as nucleation sites. Electron Backscatter Diffraction and Scanning Electron Microscopy confirm grain refinement and enhanced crystallographic texture in the alloy, while Differential Scanning Calorimetry and Thermogravimetric Analysis reveal shifts in melting behavior and improved thermal stability after GNS incorporation. The integration of these findings demonstrates that GNS significantly enhances the microstructure and properties of Sn-Ag alloys, making the alloy appropriate for high-performing applications in electronics industry, This research provides novel insights into the dynamic behavior of graphene-reinforced solder alloys, emphasizing their potential for advanced packaging technologies.