Fingerprint
Dive into the research topics of 'In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction
A. Steuwer, L. Edwards, S. Pratihar, S. Ganguly, M. Peel, M. E. Fitzpatrick, T. J. Marrow, P. J. Withers, I. Sinclair, K. D. Singh, N. Gao, T. Buslaps, J. Y. Buffière
Research output: Contribution to journal › Article › peer-review
57
Citations
(Scopus)