In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction

A. Steuwer, L. Edwards, S. Pratihar, S. Ganguly, M. Peel, M. E. Fitzpatrick, T. J. Marrow, P. J. Withers, I. Sinclair, K. D. Singh, N. Gao, T. Buslaps, J. Y. Buffière

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