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In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction
A. Steuwer, L. Edwards, S. Pratihar, S. Ganguly, M. Peel, M. E. Fitzpatrick, T. J. Marrow, P. J. Withers, I. Sinclair, K. D. Singh, N. Gao, T. Buslaps, J. Y. Buffière
Research output: Contribution to journal › Article › peer-review
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