Gradient Estimator-based Amplitude Estimation for Dynamic Mode Atomic Force Microscopy: Small-Signal Modelling and Tuning: Small-signal modeling and tuning

Hafiz Ahmed, Mohamed Benbouzid

Research output: Contribution to journalArticle

2 Downloads (Pure)

Abstract

Atomic force microscopy (AFM) plays an important role in nanoscale imaging application. AFM works by oscillating a microcantilever on the surface of the sample being scanned. In this process, estimating the amplitude of the cantilever deflection signal plays an important role in characterizing the topography of the surface. Existing approaches on this topic either have slow dynamic response e.g., lock-in-amplifier or high computational complexity e.g., Kalman filter. In this context, gradient estimator can be considered as a trade-off between fast dynamic response and high computational complexity. However, no constructive tuning rule is available in the literature for gradient estimator. In this paper, we consider small-signal modeling and tuning of gradient estimator. The proposed approach greatly simplifies the tuning procedure. Numerical simulation and experimental results are provided to demonstrate the suitability of the proposed tuning procedure.
Original languageEnglish
Article number2703
Number of pages11
JournalSensors
Volume20
Issue number9
DOIs
Publication statusPublished - 9 May 2020

Bibliographical note

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Keywords

  • Amplitude estimation
  • Atomic force microscopy
  • Gradient estimator
  • Sensor signal processing
  • Small-signal modeling

ASJC Scopus subject areas

  • Analytical Chemistry
  • Biochemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Gradient Estimator-based Amplitude Estimation for Dynamic Mode Atomic Force Microscopy: Small-Signal Modelling and Tuning: Small-signal modeling and tuning'. Together they form a unique fingerprint.

  • Cite this