FIB-SIMS analysis of an aluminum alloy/SiC metal matrix composite

Jonathan R. Silk, Richard J. Dashwood, Richard J. Chater

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Polished surfaces of a fine-grained aluminum, silicon carbide metal matrix composite (MMC) were imaged using the ion-induced secondary electron emission in a FIB ion microscope. In these images a dispersion of particles with a distinct bright contrast are seen to be mainly located at the matrix aluminum grain/subgrain boundaries, and at the matrix/reinforcement interface. The particles range in size from 20 to 200 nm. FIB-SIMS was used to identify the composition of these particles as magnesium and oxygen-rich, and so, to corroborate SEM/EDS analyses. Analysis of the FIB images of the polished section showed that the areal density of the particles with distinct bright contrast was consistent with a composition of MgAl2O4.
Original languageEnglish
Pages (from-to)488-491
Number of pages4
JournalSurface and Interface Analysis
Volume43
Issue number1-2
Early online date11 May 2010
DOIs
Publication statusPublished - 19 Jan 2011

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