Abstract
Polished surfaces of a fine-grained aluminum, silicon carbide metal matrix composite (MMC) were imaged using the ion-induced secondary electron emission in a FIB ion microscope. In these images a dispersion of particles with a distinct bright contrast are seen to be mainly located at the matrix aluminum grain/subgrain boundaries, and at the matrix/reinforcement interface. The particles range in size from 20 to 200 nm. FIB-SIMS was used to identify the composition of these particles as magnesium and oxygen-rich, and so, to corroborate SEM/EDS analyses. Analysis of the FIB images of the polished section showed that the areal density of the particles with distinct bright contrast was consistent with a composition of MgAl2O4.
Original language | English |
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Pages (from-to) | 488-491 |
Number of pages | 4 |
Journal | Surface and Interface Analysis |
Volume | 43 |
Issue number | 1-2 |
Early online date | 11 May 2010 |
DOIs | |
Publication status | Published - 19 Jan 2011 |