Fault collapsing and test generation for a circuit

Moslem Amiri, Václav Přenosil

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

Abstract

A novel method to generate a complete list of faults and their corresponding test vectors for a gate-level circuit is presented. This method creates the distinguishable faults of a circuit based on the paths they propagate, along with the test vector(s) for each fault. While the other available methods for fault list and test vector generation are expensive, this method tries to reduce the cost by avoiding all the unnecessary steps and merging the two tasks together.
Original languageEnglish
Title of host publication Deterioration, Dependability, Diagnostics 2013
Place of PublicationBrno, Czech Republic
PublisherUniversity of Defence
Pages55–61
Number of pages7
ISBN (Print)978-80-7231-939-8
Publication statusPublished - Oct 2013

Keywords

  • Fault list generation
  • test vector generation
  • fault paths

Fingerprint Dive into the research topics of 'Fault collapsing and test generation for a circuit'. Together they form a unique fingerprint.

Cite this