EthnoModel: An approach for developing and evaluating CSCW systems

Rahat Iqbal, Richard Gatward, Anne James

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

1 Citation (Scopus)

Abstract

This paper investigates the relationship between the social organisation of working environments and their relevance to system development. The objectives of this paper are therefore twofold. Firstly, it effectively analyses the social aspects of working practices using established techniques of ethnography. Such analysis provides a 'rich' and 'concrete' portrayal of the situation and thus helps systematic design of CSCW systems. Secondly, it uses meta-modelling in order to represent and model the findings of the ethnographic analysis. The value of this approach is considered by means of evaluating the development of a model to which the approach was applied.

Original languageEnglish
Title of host publication Intelligent Data Acquisition and Advanced Computing Systems
Subtitle of host publicationTechnology and Applications, 2005
PublisherIEEE
Pages633-638
Number of pages6
ISBN (Electronic)978-0-7803-9446-1
ISBN (Print)978-0-7803-9446-9, 0-7803-9445-3
DOIs
Publication statusPublished - 15 Jan 2007
Event3rd IEEE Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications - Sofia, Bulgaria
Duration: 5 Sep 20057 Sep 2005

Workshop

Workshop3rd IEEE Workshop on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications
Abbreviated titleIDAACS 2005
CountryBulgaria
CitySofia
Period5/09/057/09/05

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Keywords

  • Analysis and design
  • Document management system
  • Education

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Vision and Pattern Recognition
  • Theoretical Computer Science

Cite this

Iqbal, R., Gatward, R., & James, A. (2007). EthnoModel: An approach for developing and evaluating CSCW systems. In Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, 2005 (pp. 633-638). [4062213] IEEE. https://doi.org/10.1109/IDAACS.2005.283062