Diffusion of n-type dopants in germanium

A. Chroneos, H. Bracht

    Research output: Contribution to journalArticlepeer-review

    149 Citations (Scopus)
    124 Downloads (Pure)

    Abstract

    Germanium is being actively considered by the semiconductor community as a mainstream material for nanoelectronic applications. Germanium has advantageous materials properties; however, its dopant-defect interactions are less understood as compared to the mainstream material, silicon. The understanding of self- and dopant diffusion is essential to form well defined doped regions. Although p-type dopants such as boron exhibit limited diffusion, n-type dopants such as phosphorous, arsenic, and antimony diffuse quickly via vacancy-mediated diffusion mechanisms. In the present review, we mainly focus on the impact of intrinsic defects on the diffusion mechanisms of donor atoms and point defect engineering strategies to restrain donor atom diffusion and to enhance their electrical activation
    Original languageEnglish
    JournalApplied Physics Reviews
    Volume1
    Issue numberArticle number 011301
    Early online date2 Jan 2014
    DOIs
    Publication statusPublished - Mar 2014

    Bibliographical note

    Copyright 2014 AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Chroneos, A. and Bracht, H. (2014) Diffusion of n-type dopants in germanium. Applied Physics Reviews , volume 1 (Article number 011301) and may be found at http://scitation.aip.org/content/aip/journal/apr2/1/1/10.1063/1.4838215 .

    Fingerprint

    Dive into the research topics of 'Diffusion of n-type dopants in germanium'. Together they form a unique fingerprint.

    Cite this