Abstract
The contour method was applied to obtain residual stress fields in a laser-peened 2.0-mm-thick Al2024-T351 sample. In order to remove the effects of near-surface wire electro-discharge machining (EDM) cutting artefacts on the measured residual stresses, sacrificial blocks were attached to both surfaces of the thin sample with a polymer-based glue doped with silver particles. A data analysis routine based on bivariate spline smoothing was conducted to obtain a 2D residual stress map. The results were compared with incremental hole drilling, and X-ray diffraction and layer removal techniques. The results are in good agreement in terms of the magnitudes and the location of the peak stresses, with the exception of the contour method results. Owing to the low thickness of the samples, the data analysis is very sensitive to the parameters used in the spline fitting, leading to fluctuation in the results. It is concluded that the contour method can be applied to thin samples, however, extra attention is required. Since the uncertainty is higher compared to the conventional contour method results, it is good practice to compare the results with at least one other experimental method.
Original language | English |
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Pages (from-to) | 323-330 |
Journal | Experimental Mechanics |
Volume | 56 |
Issue number | 2 |
DOIs | |
Publication status | Published - 8 Oct 2015 |
Bibliographical note
The final publication is available at Springer via http://dx.doi.org/10.1007/s11340-015-0100-7Keywords
- Contour method
- X-ray diffraction
- incremental hole drilling
- laser peening
- thin samples