Determination of lattice orientation in aluminium alloy grains by low energy gallium ion-channelling

Jonathan R. Silk, Richard J. Dashwood, Richard J. Chater

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Polished sections of a fine-grained aluminium, silicon carbide metal matrix composite (MMC) alloy were prepared by sputtering using a low energy gallium ion source and column (FIB). The MMC had been processed by high temperature extrusion. Images of the polished surface were recorded using the ion-induced secondary electron emission. The metal matrix grains were distinguished by gallium ion-channelling contrast from the silicon carbide component. The variation of the contrast from the aluminium grains with tilt angle can be recorded and used to determine lattice orientation with the contrast from the silicon carbide (SiC) component as a reference. This method is rapid and suits site-specific investigations where classical methods of sample preparation fail.
Original languageEnglish
Pages (from-to)2064-2068
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume268
Issue number11-12
Early online date25 Feb 2010
DOIs
Publication statusPublished - Jun 2010

Keywords

  • Powder metallurgy MMC
  • Extrusion
  • Fine grain aluminium alloy
  • AA2124
  • Silicon carbide particulate
  • Gallium FIB microscopy
  • Lattice orientation
  • Channelling contrast
  • Internal reference

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