Carrier Transport mechanisms contributing to the sub-threshold current in 3C-SiC-on-Si Schottky Barrier Diodes

Anastasios Arvanitopoulos, Samuel Perkins, Konstantinos N. Gyftakis, Neo Lophitis, Mike Jennings, Marina Antoniou

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

1 Citation (Scopus)
12 Downloads (Pure)

Abstract

3C-Silicon Carbide (3C-SiC) Schottky Barrier Diodes on silicon (Si) substrates (3C-SiC-on-Si) seem not to comply with the superior wide band gap expectations in terms of excessive measured sub-threshold current. In turn, that is one of the factors which deters their commercialization. Interestingly, the forward biased part of the Current-Voltage (I-V) characteristics in these devices carries considerable information about the material quality. In this context, an advanced Technology Computer Aided Design (TCAD) model for a vertical Platinum/3C-SiC Schottky power diode is created and validated with measured data. The model includes defects originating from both the Schottky contact and the hetero-interface of 3C-SiC with Si which allows the investigation of their impact on the magnification of the sub-threshold current. For this, barrier lowering, quantum field emission and trap assisted tunneling of majority carriers need to be considered at the non-ideal Schottky interface. The simulation results and measured data allowed for the comprehensive characterization of the defects affecting the carrier transport mechanisms of the forward biased 3C-SiC on Si power rectifier for the first time.
Original languageEnglish
Title of host publication2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2018
PublisherIEEE
Pages169-173
Number of pages5
ISBN (Electronic)978-1-5386-4392-1
ISBN (Print)978-1-5386-4393-8
DOIs
Publication statusPublished - 13 Jun 2019
Event2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia) - Xi'an, China
Duration: 16 May 201818 May 2018
Conference number: 1
http://www.wipda-asia.org/index.html

Conference

Conference2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
Abbreviated titleWiPDA Asia
CountryChina
CityXi'an
Period16/05/1818/05/18
Internet address

Fingerprint

Schottky barrier diodes
Carrier transport
Silicon
Diode
Silicon carbide
Defects
Platinum
Biased
Field emission
Computer aided design
Energy gap
silicon carbide
Field Emission
Quantum Fields
Computer-aided Design
Band Gap
Trap
Electric potential
Substrates
Vertical

Bibliographical note

© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must
be obtained for all other uses, in any current or future media, including
reprinting/republishing this material for advertising or promotional purposes,
creating new collective works, for resale or redistribution to servers or lists, or
reuse of any copyrighted component of this work in other works.

Keywords

  • 3C-SiC
  • SBD
  • Schottky interface
  • TCAD
  • band diagram
  • carrier transport
  • defects
  • heteroepitaxy
  • unipolar

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Control and Optimization
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Arvanitopoulos, A., Perkins, S., Gyftakis, K. N., Lophitis, N., Jennings, M., & Antoniou, M. (2019). Carrier Transport mechanisms contributing to the sub-threshold current in 3C-SiC-on-Si Schottky Barrier Diodes. In 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2018 (pp. 169-173). [8734538] IEEE. https://doi.org/10.1109/WiPDAAsia.2018.8734538

Carrier Transport mechanisms contributing to the sub-threshold current in 3C-SiC-on-Si Schottky Barrier Diodes. / Arvanitopoulos, Anastasios; Perkins, Samuel; Gyftakis, Konstantinos N.; Lophitis, Neo; Jennings, Mike; Antoniou, Marina.

2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2018. IEEE, 2019. p. 169-173 8734538.

Research output: Chapter in Book/Report/Conference proceedingConference proceeding

Arvanitopoulos, A, Perkins, S, Gyftakis, KN, Lophitis, N, Jennings, M & Antoniou, M 2019, Carrier Transport mechanisms contributing to the sub-threshold current in 3C-SiC-on-Si Schottky Barrier Diodes. in 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2018., 8734538, IEEE, pp. 169-173, 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia), Xi'an, China, 16/05/18. https://doi.org/10.1109/WiPDAAsia.2018.8734538
Arvanitopoulos A, Perkins S, Gyftakis KN, Lophitis N, Jennings M, Antoniou M. Carrier Transport mechanisms contributing to the sub-threshold current in 3C-SiC-on-Si Schottky Barrier Diodes. In 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2018. IEEE. 2019. p. 169-173. 8734538 https://doi.org/10.1109/WiPDAAsia.2018.8734538
Arvanitopoulos, Anastasios ; Perkins, Samuel ; Gyftakis, Konstantinos N. ; Lophitis, Neo ; Jennings, Mike ; Antoniou, Marina. / Carrier Transport mechanisms contributing to the sub-threshold current in 3C-SiC-on-Si Schottky Barrier Diodes. 2018 1st Workshop on Wide Bandgap Power Devices and Applications in Asia, WiPDA Asia 2018. IEEE, 2019. pp. 169-173
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