Abstract
This work provides an experimentally driven performance comparison of commercial Gallium Nitride on Silicon (GaN-on-Si) power devices rated 600-650V at room and elevated temperatures with the focus being in assessing the on resistance (RON) increase due to hard switching in correlation to other performance indicators. Device technologies evaluated include the Enhancement (E-mode) AlGaN/GaN Hybrid Drain p-GaN layer Gate Injection Transistor (p-GaN HD-GIT), the cascode AlGaN/GaN High Electron Mobility Transistor (cascode HEMT). For the dynamic RON analysis, a special setup was utilized which allows synchronized drain and gate pulses, and the ability to switch from OFF to ON in as little as 20μs. The ability to apply a wide range of voltage levels, stress duration and temperature enabled measurable increase in the dynamic RON in both the cascode HEMT and the p-GaN HD-GIT. Nonetheless, the results highlight a strong difference in their robustness.
Original language | English |
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Title of host publication | IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, WiPDA Europe 2022 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Number of pages | 6 |
ISBN (Electronic) | 9781665488143 |
ISBN (Print) | 9781665488150 |
DOIs | |
Publication status | E-pub ahead of print - 8 Nov 2022 |
Event | 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, - Coventry, United Kingdom Duration: 18 Sept 2022 → 20 Sept 2022 |
Publication series
Name | IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, WiPDA Europe 2022 |
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Conference
Conference | 2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, |
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Abbreviated title | WiPDA Europe 2022 |
Country/Territory | United Kingdom |
City | Coventry |
Period | 18/09/22 → 20/09/22 |
Bibliographical note
Publisher Copyright:© 2022 IEEE.
Keywords
- casco de GaN
- current collapse
- E-mode
- GaN HEMT
- high temperature
- power devices
- static performance
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Electronic, Optical and Magnetic Materials
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering