An experimentally driven assessment of the dynamic-on resistance in correlation to other performance indicators in commercial Gallium Nitride power devices

Neophytos Lophitis, Samuel Perkins, Anastasios Arvanitopoulos, Soroush Faramehr, Petar Igic

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

This work provides an experimentally driven performance comparison of commercial Gallium Nitride on Silicon (GaN-on-Si) power devices rated 600-650V at room and elevated temperatures with the focus being in assessing the on resistance (RON) increase due to hard switching in correlation to other performance indicators. Device technologies evaluated include the Enhancement (E-mode) AlGaN/GaN Hybrid Drain p-GaN layer Gate Injection Transistor (p-GaN HD-GIT), the cascode AlGaN/GaN High Electron Mobility Transistor (cascode HEMT). For the dynamic RON analysis, a special setup was utilized which allows synchronized drain and gate pulses, and the ability to switch from OFF to ON in as little as 20μs. The ability to apply a wide range of voltage levels, stress duration and temperature enabled measurable increase in the dynamic RON in both the cascode HEMT and the p-GaN HD-GIT. Nonetheless, the results highlight a strong difference in their robustness.

Original languageEnglish
Title of host publicationIEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, WiPDA Europe 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages6
ISBN (Electronic)9781665488143
ISBN (Print)9781665488150
DOIs
Publication statusE-pub ahead of print - 8 Nov 2022
Event2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, - Coventry, United Kingdom
Duration: 18 Sept 202220 Sept 2022

Publication series

NameIEEE Workshop on Wide Bandgap Power Devices and Applications in Europe, WiPDA Europe 2022

Conference

Conference2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe,
Abbreviated titleWiPDA Europe 2022
Country/TerritoryUnited Kingdom
CityCoventry
Period18/09/2220/09/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • casco de GaN
  • current collapse
  • E-mode
  • GaN HEMT
  • high temperature
  • power devices
  • static performance

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electronic, Optical and Magnetic Materials
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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