Accurate Measurement of Dynamic on-State Resistances of GaN Devices under Reverse and Forward Conduction in High Frequency Power Converter

Ke Li, Arnaud Videt, Nadir Idir, Paul Evans, Mark Johnson

    Research output: Contribution to journalArticlepeer-review

    3 Citations (Scopus)
    15 Downloads (Pure)

    Abstract

    Because of trapped charges in GaN transistor structure, device dynamic on-state resistance R_\mathrm{DSon} is increased when it is operated in high frequency switched power converters, in which device is possibly operated by zero voltage switching (ZVS) to reduce its turn-on switching losses. When GaN transistor finishes ZVS during one switching period, device has been operated under both reverse and forward conduction. Therefore its dynamic R_\mathrm{DSon} under both conduction modes needs to be carefully measured to understand device power losses. For this reason, a measurement circuit with simple structure and fast dynamic response is proposed to characterize device reverse and forward R_\mathrm{DSon}. In order to improve measurement sensitivity when device switches at high frequency, a trapezoidal current mode is proposed to measure device R_\mathrm{DSon} under almost constant current, which resolves measurement sensitivity issues caused by unavoidable measurement circuit parasitic inductance and measurement probes deskew in conventional device characterization method by triangle current mode. Proposed measurement circuit and measurement method is then validated by first characterizing a SiC-mosfet with constant R_\mathrm{DSon}. Then, the comparison on GaN-HEMT dynamic R_\mathrm{DSon} measurement results demonstrates the improved accuracy of proposed trapezoidal current mode over conventional triangle current mode when device switches at 1 MHz.

    Original languageEnglish
    Article number9000652
    Pages (from-to)9652-9662
    Number of pages11
    JournalIEEE Transactions on Power Electronics
    Volume35
    Issue number9
    Early online date17 Feb 2020
    DOIs
    Publication statusPublished - 1 Sep 2020

    Bibliographical note

    This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/.

    Funder

    This work was supported in part by the U.K. Engineering and Physical Sciences Research Council under research Grants EP/K035304/1 and EP/R004390/1, and in part by the University of Lille through State Region Plan Contract Intelligent Integrated Energy Converter under Project CPER-CE2I

    Keywords

    • GaN transistor
    • Dynamic on-state resistance
    • high switching frequency
    • Reverse Conducting
    • Forward conducting
    • soft switching

    Fingerprint

    Dive into the research topics of 'Accurate Measurement of Dynamic on-State Resistances of GaN Devices under Reverse and Forward Conduction in High Frequency Power Converter'. Together they form a unique fingerprint.

    Cite this