Accurate Measurement of Dynamic ON-state Resistance of GaN Devices under Reverse and Forward Conduction in High Frequency Power Converter

Ke Li, Arnaud Videt, Nadir Idir, Paul Evans, Mark Johnson

Research output: Contribution to journalArticle


Because of trapped charges in GaN transistor structure, device dynamic ON-state resistance RDSon is increased when it is operated in high frequency switched power converters, in which device is possibly operated by zero voltage switching (ZVS) to reduce its turn-ON switching losses. When GaN transistor finishes ZVS during one switching period, device has been operated under both reverse and forward conduction. Therefore its dynamic RDSon under both conduction modes needs to be carefully measured to understand device power losses. For this reason, a measurement circuit with simple structure and fast dynamic response is proposed to characterise device reverse and forward RDSon. In order to improve measurement sensitivity when device switches at high frequency, a trapezoidal current mode is proposed to measure device RDSon under almost constant current, which resolves measurement sensitivity issues caused by unavoidable measurement circuit parasitic inductance and measurement probes deskew in conventional device characterisation method by triangle current mode. Proposed measurement circuit and measurement method is then validated by first characterising a SiC-MOSFET with constant RDSon. Then, the comparison on GaN-HEMT dynamic RDSon measurement results demonstrates the improved accuracy of proposed trapezoidal current mode over conventional triangle current mode when device switches at 1MHz.
Original languageEnglish
Pages (from-to)(In-press)
JournalIEEE Transactions on Power Electronics
Publication statusPublished - 17 Feb 2020


Bibliographical note

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  • GaN transistor
  • Dynamic on-state resistance
  • high switching frequency
  • Reverse Conducting
  • Forward conducting
  • soft switching

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