A tunable high-pass filter for simple and inexpensive size-segregation of sub-10-nm nanoparticles

N. C. Surawski, S. Bezantakos, K. Barmpounis, M. C. Dallaston, A. Schmidt-Ott, G. Biskos

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)
65 Downloads (Pure)

Abstract

Recent advanced in the fields of nanotechnology and atmospheric sciences underline the increasing need for sizing sub-10-nm aerosol particles in a simple yet efficient way. In this article, we develop, experimentally test and model the performance of a High-Pass Electrical Mobility Filter (HP-EMF) that can be used for sizing nanoparticles suspended in gaseous media. Experimental measurements of the penetration of nanoparticles having diameters down to ca 1nm through the HP-EMF are compared with predictions by an analytic, a semi-empirical and a numerical model. The results show that the HPEMF effectively filters nanoparticles below a threshold diameter with an extremely high level of sizing performance, while it is easier to use compared to existing nanoparticle sizing techniques through design simplifications. What is more, the HP-EMF is an inexpensive and compact tool, making it an enabling technology for a variety of applications ranging from nanomaterial synthesis to distributed monitoring of atmospheric nanoparticles.

Original languageEnglish
Article number45678
JournalScientific Reports
Volume7
Early online date27 Apr 2017
DOIs
Publication statusPublished - 2017
Externally publishedYes

Bibliographical note

This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

ASJC Scopus subject areas

  • General

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