Abstract
Robots can be used to deal with hazardous materials like nuclear waste. Unfortunately, electronic components are also susceptible to radiation effects. Current proposals to tackle this issue solve only parts of the problems for the specific scenarios and the specific types of radiation. At the same time, current computational devices should provide run-time capabilities to monitor and adapt to different situations. In this paper, we target a possible solution presenting a framework which provides the flexibility to employ fault-tolerant techniques on distributed systems. As proof of concept, we target a fault-tolerant technique to extend the operating time of systems in harsh environments. Results show a very low overhead, of few microseconds, to execute a majority voter with replicated tasks.
Original language | English |
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Title of host publication | 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) |
Publisher | IEEE |
Number of pages | 6 |
ISBN (Electronic) | 978-1-7281-8187-5, 978-1-7281-8186-8 |
ISBN (Print) | 978-1-7281-8188-2 |
DOIs | |
Publication status | Published - 5 Aug 2020 |
Externally published | Yes |
Event | 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design - Virtual Event, Napoli, Italy Duration: 13 Jul 2020 → 15 Jul 2020 Conference number: 26 http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts20/ |
Publication series
Name | Proceedings - 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020 |
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Conference
Conference | 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design |
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Abbreviated title | IOLTS |
Country/Territory | Italy |
City | Napoli |
Period | 13/07/20 → 15/07/20 |
Internet address |
Keywords
- SEE
- SEU
- TID effects
- fault tolerance
- soft errors
- software redundancy
- spatial redundancy
ASJC Scopus subject areas
- Hardware and Architecture
- Control and Systems Engineering
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality