PARK SYSTEMS NX20 COMPLETE AFM SYSTEM

  • Nigel M Jennett (Manager)

Facility/equipment: Equipment

    Equipments Details

    Description

    All typical modes of contact & non-contact AFM/SPM surface imaging and shape measurement; mapped force- distance indentation; nano-scratching. Has capability to test at RT<T<250 degC and in liquids.

    Contact information

    Name

    Terms of loan/booking

    Available for loan - internal and external

    Conditions for use by DTA network: Only for use as part of a collaboration Conditions of use for non-UA network: Full commercial rates current access rate is £1250 + VAT per day including operator support.

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